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Laser Diode Test
CT8501
RT & HT Die tester
Nexustest RT & HT Die Tester CT8501 is designed for laser chip LIV and spectral scanning parameter test of bare die. The system integrates cassette loading (with grip rings), DUT ID recognition, transportation, temperature-controlled testing, automatic optical inspection, cassette unloading and sorting.
CT8501 has fast test speed, and can complete the whole process of DUT handling and testing under two temperatures within 4.5 seconds (under certain test plan). The system is very suitable for mass production. CT8501 is equipped with high accuracy linear motor, Oriental Motor step motor as well as high accuracy modules, which enables the system with precision and stability.
Highlights
  • Fully automated setup
    A highly integrated test solution for bare chips
    Vision guided DUT positioning and proprietary compensation mechanism
    Automatically DUT sorting after test
    AOI integration optional after all tests done
    FFP test integration to test stations optional
  • Accurate & repeatable testing
    Complex and customized test items supported Patented probing structure, adjustable and stable contact force
    Probe card utilization optional
    Temperature range from 20 ℃ to 95 ℃, fluctuation < ±0.2 ℃
    Multiple spectrum scan recipes supported
  • Robust maintainable design
    Chuck made of high thermal conductivity and wear resistance material, service life > 2 years
  • Flexible production line adaptation
    Instruments, test plan, pass/fail criteria could be easily configured
    Database and MES connection supported
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