During the poster session, Nexustest presented "Enabling Die Level KGD Testing for CPO Optical Engine." The research discusses methods to verify Known Good Die (KGD) before final packaging. By providing an optimized optical and electrical test interface at the die level, this approach is designed to support production yield for optical engines. Recognizing its profound technical merit and industry relevance, the SWTest committee presented Nexustest with the Best Poster Presentation award.

The team also delivered a technical presentation titled "High-Throughput SiC KGD Testing: Enabling Mass Production via Dual-Die Handler Architecture". This session provided an overview of the PB6800 KGD handler, highlighting how its design ensures test reliability and safety while scaling throughput up to 4000 UPH for mass production.

At the booth, Nexustest highlighted the OPB8201 handler for optical engine testing, engaging in productive technical discussions with attendees. Nexustest appreciates the recognition from the SWTest committee and remains focused on developing practical, high-throughput test solutions for the industry. Following a highly successful exhibition in California, Nexustest looks forward to continuing its global engagement and sharing its expanding test portfolio at upcoming industry events worldwide.