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Nexustest Launches Brand-new 224Gbps/lane BERT for 1.6T Computing Interface BER Testing
May 15,2025
In recent years, driven by the rapidly growing demand for AI data centers, technology giants such as NVIDIA, Google, and Amazon have accelerated the deployment of large-scale AI compute clusters. This surge has ushered in a new wave of growth and innovation for the optical communications industry.

With high-speed SERDES technology advancing to 1.6T, AI and machine learning workloads now demand even greater system reliability. Any performance shortfall in optical modules can disrupt AI training tasks and lead to costly downtime. To prevent this, equipment vendors and optical module manufacturers must perform rigorous BER testing on computing interfaces to ensure they meet the stringent reliability standards required for AI computing.


Nexustest is dedicated to advancing the core technologies behind high-end optoelectronic test instruments. Building on our deep expertise in high-speed signal processing and integrity analysis, we have introduced a new generation of high-speed BERT solutions. As the first supplier in China to launch and sample a 1.6T BERT solution, Nexustest offers a comprehensive system platform designed for next-generation high-speed optical module testing applications.

PBT3058 - 1.6T Bit Error Ratio Tester



Compliant with CE1-224G /IEEE 802.3dj
Built-in water cooler MCB Kit
Remote head options of Bert/PA/EQ
Automatic Link Training for PG/BER optimization
Skew Tuning & ms-level BER statistic
PCS layer FEC error correction analyzer
Product Launch Timeline


时间产品
2017PBT8425/MBT5210
Launched 1st gen 100G BERT
2018rBT1250

Released 10G PON burst BER meter tester, breaking   foreign monopoly in PON testing.

Leading domestically, pioneering globally
2019 - 2021PBT8856/PBT8812
Launched 400G/800G BERT, aligning with industry trends and driving technological breakthroughs.
2022rBT2250
25G PON Test Burst BER Tester
Unveiled 25G PON burst BERT with flexible burst timing configuration and control signal matching, advancing burst test technology.
2022MTP4104/ATE8104
Released 1st gen 400G optoelectronic test solution, integrating temperature cycling, module control, and BER testing
2023 - 2024
MTP8104/rBT3250
Launched 800G all-in-one BER tester and 50G PON burst BERT, continuously optimizing products to meet industry demands.
2025PBT3058
Debuted China’s first 1.6T BERT, featuring expandable test modules, hybrid optical/electrical port testing, and multi-functional integration.


MCB Kit Options
Built-in water-cooled MCB kit (OSFP/QSFP-DD)
Add-on OSFP/QSFP-DD MCB PCBA with SMPS connectors
Application: Available for reference light source for DUT ingress RX test
Integrated CMIS/VDM protocol integration testing interface.
Electrical Head Options
Provide Aviation socket interface for supporting external BERT probe
Minimizes system link loss with flexible spatial deployment.
Signal Conditioning Options
PA: External amplifier option.
EQ: External equalizer option.

Achieves zero-bit-error in 106.25GBd PAM4 loopback BER testing.

Accurately reflects the true test metrics of the Device Under Test (DUT).

Receiver signal quality directly visualized via histograms.




Compatible with various optical modules

On-site testing of 1.6T LRO optical modules

The results of tests under different conditions at a high temperature of 70°C are as follows.

Supports ms-level transient BER sampling/analysis

Statistics accuracy improved to 10ms level.

Enables superior capture and analysis of transient BER characteristics.

Supports PCS layer RS-FEC error correction analysis




Supports de-embedding via DCA calibration or S21 file
Automatic configuration of transmitter FFE taps
Compensates for system link losses caused by PCB trace, cables, and connectors



Tuning FFE taps via DCA calibration




Automatically tuning FFE taps with S21 file
Adjustable phase skew for differential signals at transmitter




Nexustest has recently officially released a complete 1.6T computing interface test solution, which comprises three core instruments: DCA1065 Sampling Oscilloscope, CR3302 Clock Recovery Unit, and PBT305 BERT. This solution provides high-precision, end-to-end test support for next-generation AI optical interconnects, helping the industry break through bottlenecks in high-speed data communication.

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