Nexustest's newly launched S2019C 4-channel PXIe SMU achieves functional upgrades and performance breakthroughs while inheriting the hardware platform advantages of the S2011C/S2012C/S2016C series.
· Innovatively integrates auto-ranging intelligent functions· Features 4-channel synchronous I/O and measurement capability
· Supports ±40V wide voltage output range
· Delivers ±500mA (DC) and ±1A (pulse) dual-mode current output
· Breakthrough pA-level current measurement accuracy
· Excellent dynamic performance
· Fully covers traditional application scenarios while meeting stringent testing requirements for 5G RF devices and optoelectronic components in accuracy and stability.
1.Product Advantages
Resolution up to 1μV/1pA
With sub-picoampere (1pA) current resolution and microvolt (1μV) voltage sensitivity, the system delivers pinpoint accuracy for capturing nanoscale leakage and microvolt fluctuations.
4-channel independent/synchronized control
Supports four-channel parallel output and measurement, which can simultaneously complete the IV characteristic scan or characteristic parameter measurement of multiple devices, significantly improving test efficiency.
Dual-Mode Source with ±40V/±1A Wide Dynamic Range: Integrates DC and Pulse Sources in a Single Unit
DC ±40V/±500mA and pulse ±1A output capabilities make it ideal for semiconductor device testing, high-precision sensor characterization, and other demanding applications.
1MS/s High-Speed Sampling with APFC Dynamic Tuning
With a 1MS/s ultra-high-speed ADC sampling rate and Adaptive Precision Fast Control (APFC) technology, the system achieves sub-millisecond output waveform stabilization and zero-delay transient response.
DC IV output capability
Multi-Card Synchronization with Full-Stack Automation Support
Built on the PXIe protocol, the system supports multi-card cascading expansion and hardware synchronization triggering. It employs standard SCPI (Standard Commands for Programmable Instruments) for control, supporting programming languages such as C#, Python, C/C++, and LabVIEW to enable seamless integration into existing test platforms.
2. Typical applications
Semiconductor Testing: MOSFET/ IGBT/BJT IV Characterization
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►With ±40V/±1A wide-range output and measurement capabilities, combined with 1μV/1pA resolution, the system accurately captures current variations spanning from nA to A levels.
►The single-card four-channel independent output ensures cost-effective and efficient four-terminal device testing.
Silicon Optical Wafer Testing: Addressing Dark Current Challenges in Highly Integrated Photonic Chips
In silicon photonic chip fabrication, precise measurement of nA-level dark current is critical to determining device performance and yield.
Synchronized Multi-Probe Testing for Silicon Photonic Wafers
