The IEEE Applied Power Electronics
Conference and Exposition (APEC), one of the most influential professional
events in power electronics, celebrated its 40th anniversary in 2025. Held from
March 16-20 at the Georgia World Congress Center in Atlanta, USA, the
conference gathered industry leaders worldwide.
Marking its first appearance at APEC, Nexustest showcased its latest technological achievements as an innovative player in testing. The company seized this opportunity to explore future technology trends and collaboration prospects with industry peers. Among the highlights were:
- The WLBI3810 Wafer Level Burn-In Test System,
automatic wafer loading/unloading with 3 wafer cassettes for seamless parallel
burn-in of 9 wafers.
- The PB6800 SiC KGD Die Handler, up to six
test sites deliver 4000+ UPH with 0.7s test times.
APEC 2025 served as a valuable platform for Nexustest to demonstrate its technical capabilities and connect with global resources. Moving forward, the company remains committed to innovation-driven development, propelling the test and measurement industry toward greater efficiency, intelligence, and sustainability.
